Terminology Relating to Measurements Taken on Thin, Reflecting Films

Terminology Relating to Measurements Taken on Thin, Reflecting Films E2444-11E01 ASTM|E2444-11E01|en-US Terminology Relating to Measurements Taken on Thin, Reflecting Films Standard E2444 Terminology Relating to Measurements Taken on Thin, Reflecting Films> new BOS Vol. 03.01 Committee E08

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1.1 This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms are related to the standards in Section 2, which were generated by Committee E08 on Fatigue and Fracture. Terminology E1823 Relating to Fatigue and Fracture Testing is applicable to this standard.

1.2 The terms are listed in alphabetical order.

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Details

Book of Standards Volume: 03.01

Developed by Subcommittee: E08.02

Pages: 2

DOI: 10.1520/E2444-11E01

ICS Code: 01.040.31; 31.240

Terminology Relating to Measurements Taken on Thin, Reflecting Films

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