Standard
Historical
Last Updated: Mar 02, 2021
Track Document
ASTM E2444-05
Terminology Relating to Measurements Taken on Thin, Reflecting Films
Terminology Relating to Measurements Taken on Thin, Reflecting Films
E2444-05
ASTM|E2444-05|en-US
Terminology Relating to Measurements Taken on Thin, Reflecting Films
Standard
E2444 Terminology Relating to Measurements Taken on Thin, Reflecting Films>
new
BOS Vol. 03.01 Committee E08
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77.00
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Scope
1.1 This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms are related to the standards in Section , which were generated by Committee E08 on Fatigue and Fracture. Terminology E 1823 Relating to Fatigue and Fracture Testing is applicable to this standard.
1.2 The terms are listed in alphabetical order.