Transmission Electron Microscopy in Materials Research

MGH Wells; JM Capenos

doi:10.1520/STP33332S

SYMPOSIA PAPER Published: 01 January 1974

STP33332S

Transmission Electron Microscopy in Materials Research

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This paper very briefly reviews the development of transmission electron microscopy (TEM) including instrumentation and specimen preparation techniques, and generally describes typical examples of the use of TEM today in the study and understanding of the st ructure of materials. New observation techniques such as energy loss analysis, dark field imaging, the weak beam technique, Kikuchi line analysis, and computer generation of dislocation images are discussed. In addition to forefront work, many illustrations are given where TEM has greatly contributed to the optimization of properties and general improvement of many commercially important materials.

Author Information

Wells, MGH

Crucible Materials Research Center, Colt Industries, Pittsburgh, Pa.

Capenos, JM

Crucible Materials Research Center, Colt Industries, Pittsburgh, Pa.

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Details

Developed by Committee: E04

Pages: 137–168

DOI: 10.1520/STP33332S

ISBN-EB: 978-0-8031-4643-3

ISBN-13: 978-0-8031-0510-2

Transmission Electron Microscopy in Materials Research

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