Metallography—A Practical Tool for Correlating the Structure and Properties of Materials

STP Published: 1974

STP557-EB

Metallography—A Practical Tool for Correlating the Structure and Properties of Materials

Editor(s): H. Abrams, G.N. Maniar

The symposium on Metallography—A Practical Tool for Correlating the Structure and Properties of Materials, was given at the Seventy-sixth Annual Meeting of the American Society for Testing and Materials held in Philadelphia, Pa., 25-26 June 1973. Committee E04 on Metallography sponsored the symposium. Halle Abrams, Bethlehem Steel Corporation, and G. N. Maniar, Carpenter Technology Corporation, presided as symposium cochairmen.

STP Individual Article Download Free

Introduction Free

Structure-Sensitive Properties of Materials Disclosed by a Combination of X-Ray Topography X-Ray Diffraction Analysis, and Electron Microscopy Methods

S Weissman

X-Ray Diffraction — A Versatile, Quantitative, and Rapid Technique of Metallography

L Zwell

The Use of Hot-Stage Microscopy in the Study of Phase Transformations

BL Bramfitt, AO Benscoter, JR Kilpatrick, AR Marder

Examination of Materials by Coherent Light Techniques

RJ Schaefer, JA Blodgett, ME Glicksman

The Electron Microprobe as a Metallographic Tool

JI Goldstein

Transmission Electron Microscopy in Materials Research

MGH Wells, JM Capenos

High Voltage Electron Metallography — Achievements and Prospects

A Szirmae, RM Fisher

Microstructure Approach to Property Optimization in Wrought Superalloys

DR Muzyka, GN Maniar

Phase Separation as a Technique for the Characterization of Superalloys

OH Kriege

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Details

Developed by Committee: E04

Pages: 241

DOI: 10.1520/STP557-EB

ISBN-EB: 978-0-8031-4643-3

ISBN-13: 978-0-8031-0510-2