Standard Historical Last Updated: Aug 16, 2017 Track Document
ASTM E1855-96

Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors E1855-96 ASTM|E1855-96|en-US Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors Standard new BOS Vol. 12.02 Committee E10
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Scope

1.1 This test method covers how 2N2222A silicon bipolar transistors can be used either as dosimetry sensors in the determination of neutron energy spectra, or as silicon 1-MeV equivalent displacement damage fluence monitors.

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Details
Book of Standards Volume: 12.02
Developed by Subcommittee: E10.07
Pages: 11
DOI: 10.1520/E1855-96
ICS Code: 31.200