Standard Test Method for Determining Relative Image Quality of Industrial Radiographic Film Exposed to X-Radiation from 4 to 25 MeV
Standard Test Method for Determining Relative Image Quality of Industrial Radiographic Film Exposed to X-Radiation from 4 to 25 MeVE1735-07R14ASTM|E1735-07R14|en-USStandard Test Method for Determining Relative Image Quality of Industrial Radiographic Film Exposed to X-Radiation from 4 to 25 MeVStandardE1735 Standard Test Method for Determining Relative Image Quality of Industrial Radiographic Film Exposed to X-Radiation from 4 to 25 MeV>newBOS Vol. 03.03 Committee E07
$86.00
In stock
Significance and Use
4.1 This test method provides a test for determining the relative image quality response of radiographic film when exposed to 4 to 25 MeV X rays as any single component of the total X-ray system (for example, screens) is varied. By holding the technique parameters (except exposure time) and processing parameters constant, the image quality response of radiographic film may be evaluated on a relative basis.
4.2 Alternately, this test method provides a test for measuring the image quality of the X-ray system or any component of the system.
Scope
1.1 This test method covers determination of the relative image quality response of industrial radiographic film when exposed to X-radiation sources having photon energies from 4 to 25 MeV. Evaluation of the film is based on the visibility of holes in a special image quality indicator (IQI). Since results for a given film type may vary, depending on the particular processing system and processing conditions used, it is essential to state the exposure parameters and achieved density, processing chemistry, processing cycle, and processing temperature. For the purposes of this test method, it is assumed that all components of the X-ray system are operating properly and are capable of producing a given image quality. This test method is not intended to be used for films exposed with Cobalt 60 sources or X-ray sources below 4 MeV.
1.2 The values stated in either SI or inch-pound units are to be regarded as the standard. The values given in parentheses are for information only.
1.3This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
Domestic orders are delivered via United Parcel Service (UPS) or United States Postal Service (USPS). Transit
times average 3 to 5 business days. Please be aware that UPS will not deliver packages to Post Office Boxes.
International orders are delivered via courier post services which can be either a postal service, courier
service, or a combination of both. Standard Service is untraceable. Please allow 4-7 weeks for delivery.
Please be aware that carriers will not deliver packages to Post Office Boxes. Because of the variability of
customs processes and procedures in different countries, ASTM International cannot guarantee transit times to
international destinations. Customs duty and taxes are the responsibility of the consignee.
Shipping & Handling charges follow the rate schedule, below:
Order Total
Shipping & Handling Fee (US Domestic)
Up to $50.00
$18.72
$50.01 to $100.00
$20.80
$100.01 to $150.00
$29.52
$150.01 to $250.00
$39.09
$250.01 to $500.00
$56.25
$500.01 to $750.00
$76.42
$750.01 to $1000.00
$93.15
$1000.01 to $1500.00
$121.27
$1500.01 to $2500.00
$158.38
$2500.01 to $4999.00
$209.04
$5000.00 to higher
FREE
Order Total
Shipping & Handling Fee (International)
Up to $50.00
$68.72
$50.01 to $100.00
$70.80
$100.01 to $150.00
$79.52
$150.01 to $250.00
$89.09
$250.01 to $500.00
$106.25
$500.01 to $750.00
$126.42
$750.01 to $1000.00
$143.15
$1000.01 to $1500.00
$171.27
$1500.01 to $2500.00
$208.38
$2500.01 to $4999.00
$259.04
$5000.00 to higher
FREE
Shipping and Handling charges are approximate. Additional charges may be incurred if your order requires multiple shipments. This does not apply to complete sets and sections.