Applications of Electron Microfractography to Materials Research

STP Published: 1971

STP493-EB

Applications of Electron Microfractography to Materials Research

Editor(s): W. Wiebe

The Symposium on Applications of Electron Microfractography to Materials Research was given at the Seventy-third Annual Meeting of the American Society for Testing and Materials held in Toronto, Ont., Canada, 21—26 June 1970. The Sponsor of this symposium was ASTM Subcommittee II on Fractography and Associated Microstructures of ASTM Committee E24 on Fracture Testing of Metals. W. Wiebe, National Research Council of Canada, presided as symposium chairman.

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Introduction Free

W Wiebe

Correlation of Fracture Toughness, , with Fractographically Derived Plastic Stretched Zone Width—a Report of Astm E-24/II Task Group

AJ Brothers, M Hill, MT Parker, WA Spitzig, W Wiebe, UE Wolff

Microfractographic Features of Stretched Zone in an Aluminum Alloy Fracture Toughness Specimen

UE Wolff

Correlation of Microfractography and Macrofractography of AISI 4340 Steel—A Report of ASTM E-24/II Task Group

FL Carr, D Biehler, A Connolly, R Dragen, J Faller, O Johari, R Morais, MT Parker, RH Sailors

Failure Analysis of a Bonded Honeycomb Structure: A Case Study Employing SEM

CD Bailey

Application of Electron Fractography to the Study of High-temperature Cavitation in Tungsten

K Farrell, JO Stiegler

Electron Fractography of High Temperature, High Strain Rate Fracture

GA Wilber, JH Bucher

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Details

Developed by Committee: E08

Pages: 102

DOI: 10.1520/STP493-EB

ISBN-EB: 978-0-8031-4600-6

ISBN-13: 978-0-8031-0746-5