Fluorescent X-ray Spectrographic Analysis of Trace Elements, Including Thin Films

William Campbell

doi:10.1520/STP45947S

SYMPOSIA PAPER Published: 01 January 1964

STP45947S

Fluorescent X-ray Spectrographic Analysis of Trace Elements, Including Thin Films

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Limits of detectability for trace elements in metal, powder, and solution samples range from 0.1 to 100 ppm depending on the element being determined, sample composition, and the complexity of the X-ray spectra. The limits of detectability range from 0.01 to 10 μg for elements that have been preconcentrated chemically in a form suitable for X-ray spectrographic determination.

Author Information

Campbell, William, J.

U.S. Department of the Interior, College Park, Md.

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Details

Developed by Committee: E13

Pages: 48–69

DOI: 10.1520/STP45947S

ISBN-EB: 978-0-8031-6749-0

ISBN-13: 978-0-8031-6603-5

Fluorescent X-ray Spectrographic Analysis of Trace Elements, Including Thin Films

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