Techniques that Permit Successive Examinations of Specific Areas by Electron Microscopy

T. McLauchlan

doi:10.1520/STP44067S

SYMPOSIA PAPER Published: 01 January 1954

STP44067S

Techniques that Permit Successive Examinations of Specific Areas by Electron Microscopy

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In microscopy, techniques for relocating specific areas of a specimen are desirable for several reasons. First, such techniques permit a comparison of the microstructures developed by various etchants in a particular location in a sample. Second, they permit investigation of the progress of phase transformation in a given region of a specimen after various processing treatments, such as annealing, tempering, or aging. Finally, such techniques permit, for identical fields of view, a comparison of electron micrographs with corresponding light micrographs.

Author Information

McLauchlan, T., A.

Research and Development Laboratory, United States Steel Corp., Pittsburgh, Pa.

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Details

Developed by Committee: E04

Pages: 96–100

DOI: 10.1520/STP44067S

ISBN-EB: 978-0-8031-5929-7

ISBN-13: 978-0-8031-6083-5

Techniques that Permit Successive Examinations of Specific Areas by Electron Microscopy

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