Problems with Dielectric Measurements at Cryogenic Temperatures

K. Mathes; E. McGowan

doi:10.1520/STP43797S

SYMPOSIA PAPER Published: 01 January 1967

STP43797S

Problems with Dielectric Measurements at Cryogenic Temperatures

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Problems with measurements at cryogenic temperatures are described. The long leads which are needed to reach to the bottom of the cryostat introduce a number of difficulties. The very low dielectric losses which may be encountered pose special measurement problems. Optimized solutions to these and other problems are described.

Author Information

Mathes, K., N.

General Chemistry Laboratory, General Electric Co., Schenectady, N.Y.

McGowan, E., J.

Raychem Corp., Redwood City, Calif.

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Details

Developed by Committee: D09

Pages: 3–17

DOI: 10.1520/STP43797S

ISBN-EB: 978-0-8031-6021-7

ISBN-13: 978-0-8031-6175-7

Problems with Dielectric Measurements at Cryogenic Temperatures

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