X-Ray Diffraction in the Electron Probe Microanalyzer

B. Heise

doi:10.1520/STP43686S

SYMPOSIA PAPER Published: 01 January 1962

STP43686S

X-Ray Diffraction in the Electron Probe Microanalyzer

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The electron probe microanalyzer is shown to be a useful X-ray diffraction instrument which produces a particular type of diffraction pattern known as Kossel lines. The means by which the crystal orientation and the lattice constant can be obtained from Kossel lines is also demonstrated.

Author Information

Heise, B., H.

Linde Co., Tonowanda Laboratories, Tonowanda, N. Y.

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Details

Developed by Committee: E04

Pages: 182–189

DOI: 10.1520/STP43686S

ISBN-EB: 978-0-8031-5971-6

ISBN-13: 978-0-8031-6125-2

X-Ray Diffraction in the Electron Probe Microanalyzer

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