Comparative AES, ESCA, and SIMS Investigation of Oxide Films on Iron-Nickel-Chromium Alloys

GR Conner

doi:10.1520/STP38652S

SYMPOSIA PAPER Published: 01 January 1980

STP38652S

Comparative AES, ESCA, and SIMS Investigation of Oxide Films on Iron-Nickel-Chromium Alloys

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Electron spectroscopy for chemical analysis (ESCA), Auger electron spectroscopy (AES), and secondary ion mass spectrometry (SIMS) analyses were conducted on oxide films formed at room temperature on iron-nickel-chromium alloys. Results are given for controlled oxidation of sputter-cleaned surfaces with highly pure oxygen and sequential analysis by the three techniques. Mixed iron-chromium oxide films of approximately 25 Å were formed at 0.67 to 0.93 µPa∙s. ESCA and SIMS results confirm the initial formation of a mixed iron-chromium trivalent oxide ((Fe,Cr)₂O₃) and suggest that a mixed divalent iron—trivalent chromium oxide (FeCr₂O₄) is also formed in the oxide film.

Author Information

Conner, GR

Inficon Leybold-Heraeus, Inc., East Syracuse, New York

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Details

Developed by Committee: E42

Pages: 54–65

DOI: 10.1520/STP38652S

ISBN-EB: 978-0-8031-5552-7

ISBN-13: 978-0-8031-0277-4

Comparative AES, ESCA, and SIMS Investigation of Oxide Films on Iron-Nickel-Chromium Alloys

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