SYMPOSIA PAPER
Published:
01 January 1970
STP38520S
Suggested Method for Applications of X-Ray Diffraction of Clay Structural Analysis to the Understanding of the Engineering Behavior of Soils
SourceThe structure of clay minerals is described from a point of view relevant to the soil engineer. Emphasis is placed upon the composition and variability of composition of the interlayer ion-water component. In particular, variations in interlayer water content with variations in field and laboratory environmental conditions are emphasized. The direct applicability of X-ray diffraction techniques to this approach to clay mineral identification is described and recommended procedures are outlined.
Author Information
Moore, CA
University of Illinois at Chicago Circle, Chicago, Ill
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Details
Developed by Committee: D18
Pages: 291–300
DOI: 10.1520/STP38520S
ISBN-EB: 978-0-8031-5570-1
ISBN-13: 978-0-8031-0051-0