Survey of Damage Thresholds at 532 NM for Production-RUN optical Components
SourceWe report the results of a survey of 532-nm, 0.7-ns damage thresholds for a variety of optical components. The optics were all samples from current production runs, which included high-reflector and anti-reflector films, beam dumps, leached AR surfaces, and multiwavelength AR and HR films.
The experiment was similar to the usual 1064-nm damage measurement. The green light pulses were produced by frequency-doubling 1-ns pulses from a Nd:glass laser. The 532-nm beam was then focused to a spot size of about 2 mm diameter at the sample. Beam profiles were recorded on a vidicon and on 1-Z photographic plates.
Thresholds for the AR and HR films were typically 2–5 J/cm2, somehwat lower than might have been expected. Some of the beam dumps damaged at 2 J/cm2. Bare and graded-index surface thresholds were found to be comparable to 1-ns, 1064-nm thresholds.