Advances in X-ray Metallography

JB Newkirk

doi:10.1520/STP32080S

SYMPOSIA PAPER Published: 01 January 1970

STP32080S

Advances in X-ray Metallography

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X-ray metallography, as defined for this review, consists of the application of X-rays to the microstructural characterization of solids. Basic crystal structure analysis is excluded, though the identification of phases whose crystal structures are known is not: the subject is briefly reviewed, using examples taken mostly from recently published works. The principles and typical applications of X-ray diffraction topography are emphasized. Other methods to which specific references are made include microradiography, macrostrain measurement, Kossel pattern analysis, and applications of long wavelength X-ray analysis.

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Newkirk, JB

University of Denver, Denver, Colo.

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Details

Developed by Committee: E04

Pages: 152–182

DOI: 10.1520/STP32080S

ISBN-EB: 978-0-8031-4591-7

ISBN-13: 978-0-8031-0747-2

Advances in X-ray Metallography

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