STP
Published:
1962
STP317-EB
Symposium on Advances in Electron Metallography and Electron Probe Microanalysis
Table of Contents
Introduction Free
C. M. Schwartz
J. M. Capenos, J. J. Hauser, B. R. Banerjee
V. A. Phillips
A. P. Young, C. W. Melton, C. M. Schwartz
S. Ohh, K. G. Carroll
W. C. Bigelow
James C. Wilkins, R. E. Pence
G. I. Madden, D. L. Sponseller, W. C. Bigelow
T. F. Beals, W. C. Bigelow
B. R. Banerjee, J. M. Capenos, J. J. Hauser
N. Takahashi, H. Kosuge
H. J. Beattie
B. H. Heise
Bani R. Banerjee
Related
Reprints and Permissions
Details
Developed by Committee: E04
DOI: 10.1520/STP317-EB
ISBN-EB: 978-0-8031-5971-6
ISBN-13: 978-0-8031-6125-2