An Eddy-Current Decay Technique for Low-Temperature Resistivity Measurements

KT Hartwig

doi:10.1520/STP27585S

SYMPOSIA PAPER Published: 01 January 1981

STP27585S

An Eddy-Current Decay Technique for Low-Temperature Resistivity Measurements

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The eddy-current decay technique developed by Bean for restivity determination is well suited for material characterization studies. The technique is shown to be an excellent method for determining the terminal solid-solution phase boundary in aluminum-gold (Al-Au), for following age hardening in dilute Al-Au alloys, and for detecting anisotropic electrical resistivity in cold-worked aluminum. Rapid and highly accurate restivities are measured with a basic circuit arrangement incorporating a digital oscilloscope.

Author Information

Hartwig, KT

Engineering Experiment Station, University of Wisconsin, Madison, Wisc.

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Details

Developed by Committee: E07

Pages: 157–172

DOI: 10.1520/STP27585S

ISBN-EB: 978-0-8031-4792-8

ISBN-13: 978-0-8031-0752-6

An Eddy-Current Decay Technique for Low-Temperature Resistivity Measurements

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