Application of the Ronchi Ruling Beam Profiling Method to Axially Symmetric Laser Beams

RM O'Connell; C-H Chen

doi:10.1520/STP26486S

SYMPOSIA PAPER Published: 01 January 1990

STP26486S

Application of the Ronchi Ruling Beam Profiling Method to Axially Symmetric Laser Beams

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The application of the Ronchi ruling beam characterization method to axially symmetric optical beams is analyzed. Specific results are derived for the Airy and focused annulus diffraction patterns. Plots of the ratio of minimum to maximum transmitted optical power versus the first null radius of the beam functions show that for the Airy pattern and other focused annuli with obscuration ratios smaller than approximately 0.30, the method should be just as useful as with Gaussian beams.

Author Information

O'Connell, RM

Chen, C-H

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Details

Developed by Committee: E13

Pages: 187–199

DOI: 10.1520/STP26486S

ISBN-EB: 978-0-8031-5157-4

ISBN-13: 978-0-8031-4478-1

Application of the Ronchi Ruling Beam Profiling Method to Axially Symmetric Laser Beams

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