SYMPOSIA PAPER
Published:
01 January 1988
STP18579S
Nondestructive Depth Profiling of Optically Transparent Films by Spectroscopic Ellipsometry
SourceSpectroscopic ellipsometric (SE) measurements followed by linear regression analysis of the SE data obtained on optically transparent thin films of ZnS and MgO on vitreous silica substrates, reveal the distribution of voids (or low density regions) in these thin films.
Author Information
Vedam, K
Kim, SY
D'Aries, L
Guenther, AH
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Details
Developed by Committee: E13
Pages: 392–396
DOI: 10.1520/STP18579S
ISBN-EB: 978-0-8031-5032-4
ISBN-13: 978-0-8031-4477-4