Techniques in Thermal Analysis: Hyphenated Techniques, Thermal Analysis of the Surface, and Fast Rate Analysis
Editor(s): Wei-Ping Pan, Lawrence Judovits
Nine peer-reviewed papers reflect the latest research in thermal analysis, including fast scan calorimetry in both instrument development and techniques.
Sections cover:
Hyphenated Techniques—seven papers cover the use of thermogravimetric analysis (TGA) with another technique. Topics deal with temperature-modulated differential scanning calorimetry; improved modeling when using hyphenated techniques; a simple calibration method for the quantitative use of mass spectrometry with TGA for a variety of encountered off gases; and much more.
Fast Rate Analysis—covers fast scan calorimetry in both instrument development and techniques. Fast heating rates were employed to study epoxy curing and fast rate analysis allowed the separation of the glass transition and cure exotherm.
Thermal Analysis of the Surface—discusses the use of a modified atomic force microscope (AFM), or Micro-Thermal Analysis, that uses the AFM probe as a thermal device.
Table of Contents
Richard E. Lyon, Richard N. Walters, Stanislav I. Stoliarov
Alan T. Riga, Michael Golinar, Kenneth S. Alexander
Alan T. Riga, Kenneth S. Alexander, Kevin Williams
Wendy J. Collins, Corey DuBois, R. Thomas Cambron, Nancy L. Redman-Furey, Adrienne S. Bigalow Kern
Nancy L. Redman-Furey, Michael L. Dicks, Jane Godlweski, Dana C. Vaughn, Wendy J. Collins
Nancy L. Redman-Furey, Michael L. Dicks, Jane Godlweski, Dana C. Vaughn, Wendy J. Collins
Zhongxian Cheng, Hui-ling Chen, Yan Zhang, Pauline Hack, Wei-Ping Pan
Adrienne S. Bigalow Kern, Wendy J. Collins, R. Thomas Cambron, Nancy L. Redman-Furey
Carlton G. Slough
Ramón Artiaga, Ricardo Cao, Salvador Naya, Bárbara González-Martin, José L. Mier, Ana Garcia
Quentin Lineberry, Thandi Buthelezi, Wei-Ping Pan
Bryan Bilyeu, Witold Brostow, Kevin P. Menard
Carlton G. Slough, Azzedine Hammiche, Mike Reading, Hubert M. Pollock