Journal
Published Online: 14 February 2020
Volume 9, Issue 1
Classification of Defect Types in SLM Ti-6Al-V4 by X-ray Refraction Topography
CODEN: MPCACD
Abstract
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Author Information
Laquai, René
Division 8.5 Micro-NDE, Federal Institute for Materials Research and Testing, Berlin, Germany
Müller, Bernd Randolf
Division 8.5 Micro-NDE, Federal Institute for Materials Research and Testing, Berlin, Germany
Kasperovich, Galina
Institute of Materials Research, German Aerospace Center, Cologne, Germany
Requena, Guillermo
Institute of Materials Research, German Aerospace Center, Cologne, Germany
Haubrich, Jan
Institute of Materials Research, German Aerospace Center, Cologne, Germany
Bruno, Giovanni
Division 8.5 Micro-NDE, Federal Institute for Materials Research and Testing, Berlin, Germany
Institute for Physics and Astronomy, University of Potsdam, Potsdam, Germany
Pages: 12
Price: $25.00
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Details
Stock #: MPC20190080
ISSN: 2379-1365
DOI: 10.1520/MPC20190080