Journal
Published Online: 27 June 2013
Volume 2, Issue 1
Is There Possible Bias in ASTM E112 Planimetric Grain Size Measurements?
CODEN: MPCACD
Abstract
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Author Information
Vander Voort, George
Consultant, Struers Inc., Wadsworth, IL, US
Pages: 12
Price: $25.00
Reprints and Permissions
Details
Stock #: MPC20120048
ISSN: 2165-3992
DOI: 10.1520/MPC20120048