MONOGRAPH Published: 01 January 2011
MONO10129M

Wavelength Dispersive X-ray Spectrometry

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The wavelength range of interest in X-ray fluorescence (XRF) spectrometry is roughly the range between 0.04 and 2 nm. This allows the analysis of the elements from fluorine upward to the transuranics, either on their K or L characteristic lines. Using special precautions and dedicated multilayers (see section on “Diffraction and the Analyzing Crystal”), the range can be enlarged to 11 nm, including the characteristic lines of beryllium. Energy and wavelength are related according to the following equation: E = h c λ where E is the photon energy; h is Planck's constant (6.626 10−34 J s, or 4.135 10−15 eV s); c is the speed of light in vacuum ( 3 × 10 8 m / s ); and λ is wavelength. By substituting these values in Eq 1, and expressing photon energy in kiloelectronvolts and wavelength in nanometres, the following is obtained: E = 1.24 λ or λ = 1.24 E

Author Information

Vrebos, Bruno, A. R.
PANalyticol B.V., Almelo, the Netherlands
Glose, Timothy, L.
PANalytical Inc., Westborough, MA
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Details
Developed by Committee: D02
Pages: 349–373
DOI: 10.1520/MONO10129M
ISBN-EB: 978-0-8031-8430-5
ISBN-13: 978-0-8031-7020-9