MANUAL Published: 01 January 2007
MNL11196M

Electron Microscopy-Scanning Probe Microscopy

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AN IN-DEPTH DESCRIPTION OF ELECTRON MICROSCOPY AND SCANNING probe microscopy falls outside the scope of this book, but in this chapter a short introduction is given to the transmission electron microscope (TEM), the scanning electron microscope (SEM), the focused ion beam techniques (FIB), and a number of scanning probe microscopes (SPM).

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Developed by Committee: E04
Pages: 558–561
DOI: 10.1520/MNL11196M
ISBN-EB: 978-0-8031-5691-3
ISBN-13: 978-0-8031-4265-7