Journal
Published Online: 22 June 2021
Volume 50, Issue 1
Robust Fabric Defects Inspection System Using Deep Learning Architecture
CODEN: JTEVAB
Abstract
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Author Information
Shanthi, T.
Sona Signal and Image Processing Laboratory (Sona SIPRO), Department of Electronics Communication and Engineering, Sona College of Technology, Salem, India
Paramasivam, M. E.
Sona Signal and Image Processing Laboratory (Sona SIPRO), Department of Electronics Communication and Engineering, Sona College of Technology, Salem, India
Prakash, C.
Department of Handloom and Textiles, Indian Institute of Handloom Technology, Ministry of Textiles, Government of India, Fulia Colony, Shantipur, Nadia, West Bengal, India
Manju, K.
Sona Signal and Image Processing Laboratory (Sona SIPRO), Department of Electronics Communication and Engineering, Sona College of Technology, Salem, India
Paul, Eldho
Sona Signal and Image Processing Laboratory (Sona SIPRO), Department of Electronics Communication and Engineering, Sona College of Technology, Salem, India
Anand, R.
Sona Signal and Image Processing Laboratory (Sona SIPRO), Department of Electronics Communication and Engineering, Sona College of Technology, Salem, India
Dinesh, P. M.
Sona Signal and Image Processing Laboratory (Sona SIPRO), Department of Electronics Communication and Engineering, Sona College of Technology, Salem, India
Sabeenian, R. S.
Sona Signal and Image Processing Laboratory (Sona SIPRO), Department of Electronics Communication and Engineering, Sona College of Technology, Salem, India
Raja, D.
Department of Fashion Technology, Sona College of Technology, Salem, India
Pages: 10
Price: $25.00
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Details
Stock #: JTE20200778
ISSN: 0090-3973
DOI: 10.1520/JTE20200778