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Journal Published Online: 02 October 2018
Volume 47, Issue 5

Analysis of MFL Model for Sucker Rod Defects and Its MFL Signal Processing

CODEN: JTEVAB

Abstract

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Author Information

Zhang, Ou
School of Electronic and Information Engineering, Beijing Jiaotong University, Beijing, China
Wei, Xueye
School of Electronic and Information Engineering, Beijing Jiaotong University, Beijing, China
Pages: 16
Price: $25.00
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Stock #: JTE20170687
ISSN: 0090-3973
DOI: 10.1520/JTE20170687