Journal
Published Online: 14 May 2018
Volume 46, Issue 4
Testing the Image Quality of Cabinet X-ray Systems for Security Screening: The Revised ASTM F792 Standard
CODEN: JTEVAB
Abstract
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Author Information
Glover, Jack L.
Theiss Research, La Jolla, CA, USA
National Institute of Standards and Technology, Gaithersburg, MD, USA
Tosh, Ronald E.
National Institute of Standards and Technology, Gaithersburg, MD, USA
Hudson, Lawrence T.
National Institute of Standards and Technology, Gaithersburg, MD, USA
Paulter, Nicholas G.
National Institute of Standards and Technology, Gaithersburg, MD, USA
Pages: 10
Price: $25.00
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Details
Stock #: JTE20170349
ISSN: 0090-3973
DOI: 10.1520/JTE20170349