Testing and Ranking Multiple Wafer-Manufacturing Processes With Fuzzy-Quality Data

Journal Published Online: 02 February 2016

Volume 44, Issue 5

CODEN: JTEVAB

Abstract

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Wu, Chien-Wei

Dept. of Industrial Engineering and Engineering Management, National Tsing Hua Univ., Hsinchu, TW

Liao, Mou-Yuan

Dept. of Statistics and Informatics Science, Providence Univ., Taichung, TW

Lin, Chi-Wei

Dept. of Industrial Engineering and Systems Management, Feng Chia Univ., Taichung, TW

Lin, Tzu-Ling

Dept. of Industrial Engineering and Systems Management, Feng Chia Univ., Taichung, TW

Pages: 8

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Stock #: JTE20150262

ISSN: 0090-3973

DOI: 10.1520/JTE20150262