Journal
Published Online: 21 August 2015
Volume 44, Issue 4
Degradation Behavior of BaTiO Dielectrics for MLCCs by an Accelerated Life Test With Voltage and Temperature Stress Factors
CODEN: JTEVAB
Abstract
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Author Information
Kim, Juyoung
School of Materials Science and Engineering, Pusan National Univ., Busan, KR
Lee, Seung-Hwan
Research and Development Center, Samwha Capacitor Co., Ltd., Yongin, KR
Yoon, Jung-Rag
Research and Development Center, Samwha Capacitor Co., Ltd., Yongin, KR
Van Tyne, Chester
Dept. of Metallurgical and Materials Engineering, Colorado School of Mines, Golden, CO, US
Ohk, Ki-Yool
Dept. of Business Administration, Pusan National Univ., Busan, KR
Lee, Heesoo
School of Materials Science and Engineering, Pusan National Univ., Busan, KR
Pages: 7
Price: $25.00
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Details
Stock #: JTE20140522
ISSN: 0090-3973
DOI: 10.1520/JTE20140522