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Journal Published Online: 10 October 2014
Volume 43, Issue 6

Assessing True TFT-LCD Process Quality in the Presence of Unavoidable Measurement Errors

CODEN: JTEVAB

Abstract

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Author Information

Liao, Mou-Yuan
Dept. of Statistics and Informatics Science, Providence Univ., Taichung, TW
Wu, Chien-Wei
Dept. of Industrial Engineering and Engineering Management, National Tsing Hua Univ., Hsinchu, TW
Lin, Chien-Hua
Dept. of Statistics and Informatics Science, Providence Univ., Taichung, TW
Pages: 8
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Details
Stock #: JTE20140103
ISSN: 0090-3973
DOI: 10.1520/JTE20140103