Journal
Published Online: 01 November 1998
Volume 26, Issue 6
A Neural-Based Analog IC Parametric Fault Diagnostic System with Discriminant Simulation Sampling
CODEN: JTEVAB
Abstract
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Author Information
Wu, A
City University of Hong Kong, Kowloon, Hong Kong
Pages: 12
Price: $25.00
Reprints and Permissions
Details
Stock #: JTE12113J
ISSN: 0090-3973
DOI: 10.1520/JTE12113J