Journal
Published Online: 30 March 2005
Volume 33, Issue 3
Estimation of the Uncertainty of Fe in Metallic Silicon Determined by Inductively Coupled Plasmas-Atomic Emission Spectroscopy
CODEN: JTEVAB
Abstract
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Author Information
Wang, DW
Liaoning Entry-Exit Inspection and Quarantine Bureau, Dalian, PR, China
Wang, SW
The Open University of Hong Kong, Hong Kong, PR, China
Zhao, SQ
Statistics, Animal Science, Shenyang Agriculture University, Shenyang, PR, China
Pages: 5
Price: $25.00
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Details
Stock #: JTE12061
ISSN: 0090-3973
DOI: 10.1520/JTE12061