Journal
Published Online: 01 March 1978
Volume 6, Issue 2
“PARS”—A Portable X-Ray Analyzer for Residual Stresses
CODEN: JTEVAB
Abstract
<
Author Information
James, M
Laboratorium voor Fysische Metaalkunde, Nijenborgh 18, Universiteitscomplex Paddepoel, University of Groningen, The Netherlands
Cohen, JB
The Technological Institute, Northwestern University, Evanston, Ill.
Pages: 7
Price: $25.00
Reprints and Permissions
Details
Stock #: JTE10925J
ISSN: 0090-3973
DOI: 10.1520/JTE10925J