Journal
Published Online: 06 May 2011
Volume 39, Issue 4
A Clustering Analysis Model for Golden Die Extractions Based on Wafer Acceptance Test at Semiconductor R&D Stage
CODEN: JTEVAB
Abstract
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Author Information
Liu, S.
Dept. of Information Management, Yuanpei Univ. of Technology, Hsinchu County, Taiwan
Chen, F.
Dept. of Industrial Engineering and Engineering Management, National Tsing Hua Univ., Hsinchu County, Taiwan
Lin, S.
Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu County, Taiwan
Chang, K.
Dept. of Computer Science, National Tsing Hua Univ., Hsinchu County, Taiwan
Yu, S.
Dept. of Industrial Engineering and Engineering Management, National Tsing Hua Univ., Hsinchu County, Taiwan
Pages: 7
Price: $25.00
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Details
Stock #: JTE103029
ISSN: 0090-3973
DOI: 10.1520/JTE103029