Journal Published Online: 01 May 2009
Volume 37, Issue 4

Reliability Life Prediction of VFD by Constant Temperature Stress Accelerated Life Tests and Maximum Likelihood Estimation

CODEN: JTEVAB

Abstract

<

Author Information

Zhang, Jian-Ping
School of Thermal Power and Environmental Engineering, Shanghai University of Electric Power, China
Wang, Rui-Tao
School of Thermal Power and Environmental Engineering, Shanghai University of Electric Power, China
Pages: 5
Price: $25.00
Related
Reprints and Permissions
Reprints and copyright permissions can be requested through the
Copyright Clearance Center
Details
Stock #: JTE102191
ISSN: 0090-3973
DOI: 10.1520/JTE102191