Journal
Published Online: 05 January 2004
Volume 1, Issue 1
Interface Strength Evaluation of LSI Devices Using the Weibull Stress
CODEN: JAIOAD
Abstract
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Author Information
Minami, F
Graduate School of engineering, Osaka University, Suita, Osaka, Japan
Takahara, W
Nakamura, T
Pages: 10
Price: $25.00
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Details
Stock #: JAI10624
ISSN: 1546-962X
DOI: 10.1520/JAI10624