Journal
Published Online: 11 July 2011
Volume 8, Issue 6
Particle Characterization and Sizing: SEM Utilizing Automated Electron Beam and AFA Software for Particle Counting and Particle Characterization
CODEN: JAIOAD
Abstract
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Author Information
Herguth, William
Herguth Laboratories, Inc., Vallejo
Nadeau, Guy
Herguth Laboratories, Inc., Vallejo
Pages: 8
Price: $25.00
Reprints and Permissions
Details
Stock #: JAI103381
ISSN: 1546-962X
DOI: 10.1520/JAI103381