Standard Test Method for Temperature Calibration of Dynamic Mechanical Analyzers Using Thermal Lag
Standard Test Method for Temperature Calibration of Dynamic Mechanical Analyzers Using Thermal LagE3301-22ASTM|E3301-22|en-USStandard Test Method for Temperature Calibration of Dynamic Mechanical Analyzers Using Thermal LagStandardE3301 Standard Test Method for Temperature Calibration of Dynamic Mechanical Analyzers Using Thermal Lag>newBOS Vol. 14.01 Committee E37
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Significance and Use
5.1 Dynamic mechanical analysis monitors changes in the viscoelastic properties (that is, storage modulus, loss modulus, tangent angle delta) of a material as a function of temperature and frequency, providing a means to quantify these changes. In many cases, the value to be assigned is the temperature of the transition or event under study. Therefore, the temperature axis (abscissa) of the dynamic mechanical analysis thermal curve must be accurately calibrated by adjusting the measured temperature scale to match the assumed specimen temperature over the temperature range of interest.
Scope
1.1 This test method describes the temperature calibration of a dynamic mechanical analyzer using thermal lag over the temperature range of –100 °C to 300 °C.
1.2 This standard may be compared to Test Methods E1867.
1.3 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.4This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.
1.5This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
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