Standard Practice for Describing and Measuring Performance of Laboratory Fourier Transform Near-Infrared (FT-NIR) Spectrometers: Level Zero and Level One Tests
Standard Practice for Describing and Measuring Performance of Laboratory Fourier Transform Near-Infrared (FT-NIR) Spectrometers: Level Zero and Level One TestsE1944-98R02ASTM|E1944-98R02|en-USStandard Practice for Describing and Measuring Performance of Laboratory Fourier Transform Near-Infrared (FT-NIR) Spectrometers: Level Zero and Level One TestsStandardE1944 Standard Practice for Describing and Measuring Performance of Laboratory Fourier Transform Near-Infrared (FT-NIR) Spectrometers: Level Zero and Level One Tests>newBOS Vol. 03.06 Committee E13
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Significance and Use
This practice permits an analyst to compare the general performance of a laboratory instrument on any given day with the prior performance of that instrument. This practice is not intended for comparison of different instruments with each other, nor is it directly applicable to dedicated process FT-NIR analyzers. This practice requires the use of a check sample compatible with the instrument under test as described in 5.3.
Scope
1.1 This practice covers two levels of tests to measure the performance of laboratory Fourier transform near infrared (FT-NIR) spectrometers. This practice applies to the short-wave near infrared region, approximately 800 nm (12 500 cm-1) to 1100 nm (9090.91 cm-1); and the long-wavelength near infrared region, approximately 1100 nm (9090.91 cm-1) to 2500 nm (4000 cm-1). This practice is intended mainly for transmittance measurements of gases and liquids, although it is broadly applicable for reflectance measurements.
1.2 The values stated in SI units are to be regarded as the standard.
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
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