Standard
Historical
Last Updated: Aug 16, 2017
Track Document
ASTM E673-02a
Standard Terminology Relating to Surface Analysis
Standard Terminology Relating to Surface Analysis
E0673-02A
ASTM|E0673-02A|en-US
Standard Terminology Relating to Surface Analysis
Standard
E673 Standard Terminology Relating to Surface Analysis>
new
BOS Vol. 03.06 Committee E42
$
86.00
In stock
Scope
1.1 This terminology is related to the various disciplines involved in surface analysis.
1.2 The definitions listed apply to (a) Auger electron spectroscopy (AES), (b) X-ray photoelectron spectroscopy (XPS), (c) ion-scattering spectroscopy (ISS), (d) secondary ion mass spectrometry (SIMS), and (e) energetic ion analysis (EIA).