Journal Published Online: 01 December 2002
Volume 24, Issue 4

Deflection Measurements of Laminated Thin Plates Using Electronic Speckle Pattern Interferometry

CODEN: JCTRER

Abstract

<

Author Information

Golda, D
Mechanical and Aerospace Engineering, Rutgers, The State University of New Jersey, Piscataway, NJ
Kedlaya, D
Mechanical and Aerospace Engineering, Rutgers, The State University of New Jersey, Piscataway, NJ
Pelegri, AA
Mechanical and Aerospace Engineering, Rutgers, The State University of New Jersey, Piscataway, NJ
Pages: 9
Price: $25.00
Related
Reprints and Permissions
Reprints and copyright permissions can be requested through the
Copyright Clearance Center
Details
Stock #: CTR10927J
ISSN: 0884-6804
DOI: 10.1520/CTR10927J