Journal
Published Online: 05 December 2017
Volume 6, Issue 1
Characterization of CRM Binders with Wax Additives Using an Atomic Force Microscopy (AFM) and an Optical Microscopy
CODEN: ACEMF9
Abstract
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Author Information
Kim, Hyun Hwan
Department of Engineering Technology, Texas State University, San Marcos, TX
Mazumder, Mithil
Materials Science, Engineering, and Commercialization, Texas State University, San Marcos, TX
Torres, Anthony
Department of Engineering Technology, Texas State University, San Marcos, TX
Lee, Soon-Jae
Department of Engineering Technology, Texas State University, San Marcos, TX
Lee, Moon-Sup
Department of Engineering Technology, Korea Institute of Civil Engineering and Building Technology, Goyang, South Korea
Pages: 22
Price: $25.00
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Details
Stock #: ACEM20160071
ISSN: 2379-1357
DOI: 10.1520/ACEM20160071